A Radiation Hard LUT Block with Auto-Scrubbing

We present a Silicon-on-Insulator based Look-up Table and configuration memory for application within a radiation hard reconfigurable system. The configuration storage includes a non-volatile EEPROM built using a standard single polysilicon Silicon on Insulator CMOS process linked to a Schmitt sense amplifier and transmission gate LUT structure. A simple current detector of the type used in conventional RAM circuits allows the configuration memory to be set up to exhibit self correcting, or "autoscrubbing" behavior. While the SOI EEPROM and Schmitt exhibit high intrinsic resistance to radiation induced errors, it is still possible for a sequence of two particle strikes to cause the configuration value to be lost. We undertake a preliminary analysis of the Single Event error Rate (SER) performance that results from this behavior.