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Adaptive random testing by exclusion through test profile

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conference contribution
posted on 2024-11-23, 05:55 authored by Huai Liu, Xiaodong Xie, Jing Yang, Yansheng Lu, Tsong Yueh Chen
One major objective of software testing is to reveal software failures such that program bugs can be removed. Random testing is a basic and simple software testing technique, but its failure-detection effectiveness is often controversial. Based on the common observation that program inputs causing software failures tend to cluster into contiguous regions, some researchers have proposed that an even spread of test cases should enhance the failure-detection effectiveness of random testing. Adaptive random testing refers to a family of algorithms to evenly spread random test cases based on various notions. Restricted random testing, an algorithm to implement adaptive random testing by the notion of exclusion, defines an exclusion region around each previously executed test case, and selects test cases only from outside all exclusion regions. Although having a high failure-detection effectiveness, restricted random testing has a very high computation overhead, and it rigidly discards all test cases inside any exclusion region, some of which may reveal software failures. In this paper, we propose a new method to implement adaptive random testing by exclusion, where test cases are simply selected based on a well-designed test profile. The new method has a low computation overhead and it does not omit any possible program inputs that can detect failures. Our experimental results show that the new method not only spreads test cases more evenly but also brings a higher failure-detection effectiveness than random testing.

History

Related Materials

  1. 1.
    DOI - Is published in 10.1109/QSIC.2010.61
  2. 2.
    ISSN - Is published in 15506002

Start page

147

End page

156

Total pages

10

Outlet

Proceedings of the 10th International Conference on Quality Software, QSIC 2010

Name of conference

QSIC 2010

Publisher

IEEE

Place published

USA

Start date

2010-07-14

End date

2010-07-15

Language

English

Copyright

© 2010 IEEE.

Notes

© 2010 IEEE. Reprinted, with permission, from Liu, H, Xie, X, Yang, J, Lu, Y and Chen, T 2010, 'Adaptive random testing by exclusion through test profile', in Proceedings of the 10th International Conference on Quality Software, QSIC 2010, USA, 14-15 July 2010, pp. 147-156. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of RMIT University's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

Former Identifier

2006040966

Esploro creation date

2020-06-22

Fedora creation date

2013-05-13

Open access

  • Yes