RMIT University
Browse

Development of a conductive photoresist with a mixture of SU-8 and HCL doped polyaniline

Download (5.92 MB)
conference contribution
posted on 2024-11-23, 00:34 authored by Uma Annaiyan, Kourosh Kalantar ZadehKourosh Kalantar Zadeh, Qiang Fang, Irena CosicIrena Cosic
A novel electrically conductive photoresist has been formulated to fabricate microcomponents. The developed conductive photoresist is based upon SU-8 photopolymer, an insulating negative-tone epoxy, in which protonically doped polyaniline (PANI) nanoparticles have been dispersed to enhance the electrical properties. The characteristics of this new conductive photoresist have been studied via electrical measurements. The process for preparing the conductive films from the combination of EB (Emeraldine base) PANI, SU-8 and NMP (N-methyl-2-pyrrolidinone) will be presented. Different weight percentages (wt%) of SU-8 in the above combination have been prepared and spin coated to form thin-films which have been protonated with HCl. The conductivities of the thin- films were measured using a four point probe. The highest conductivity achieved was approximately 1.6 S/cm for the mixture of 10 wt% of SU-8 25 with EB-PANI mixed with NMP. The morphology of the thin-films was studied using a scanning electron microscopy (SEM).

History

Start page

1

End page

5

Total pages

5

Outlet

Proceedings of the IEEE TENCON Region 10 Conference

Editors

R Harris and H King

Name of conference

TENCON 2005 IEEE Region 10

Publisher

IEEE

Place published

Melbourne

Start date

2005-11-21

End date

2005-11-24

Language

English

Copyright

© 2005 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

Former Identifier

2005001645

Esploro creation date

2020-06-22

Fedora creation date

2009-09-01

Open access

  • Yes

Usage metrics

    Scholarly Works

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC