RMIT University
Browse

Low temperature of formation of nickel germanide on crystalline germanium

conference contribution
posted on 2024-10-31, 18:23 authored by Fahid Algahtani, Mark Blackford, Mohammad Saleh N Alnassar, Geoffrey Reeves, Patrick LeechPatrick Leech, Elena PirogovaElena Pirogova, Anthony HollandAnthony Holland
Thin films of nickel germanide conveniently form at the relatively low temperature of 300C in a matter of minutes and at even lower temperatures over a longer time. Here we report on the formation of NiGe on crystalline germanium substrates at low temperatures (less than 300C). Ni films deposited on Ge substrates formed NiGe by heating the samples in an atmosphere nearly void of oxygen. Ni films of thickness 50 to 400nm were deposited on crystalline germanium and heat treatments undertaken on samples for time durations at different temperatures of 5 minutes to 12 hours. It was found that the thickness was not a significant factor and that NiGe formed in a few minutes for all thicknesses heated at 300 C. Long durations were required for the lowest temperature of formation

History

Related Materials

  1. 1.
    DOI - Is published in 10.1109/MIEL.2014.6842135
  2. 2.
    ISBN - Is published in 9781479952977 (urn:isbn:9781479952977)

Start page

253

End page

256

Total pages

4

Outlet

Proceedings of the 29th International Conference on Microelectronics (MIEL 2014)

Editors

Dr. Ninoslav Stojadinovic, Dimitrijev, J. Liou, S.Selberherr, H.Wong, T. Jovanovic

Name of conference

MIEL 2014

Publisher

IEEE

Place published

United States

Start date

2014-05-12

End date

2014-05-14

Language

English

Copyright

© 2014 IEEE

Former Identifier

2006050236

Esploro creation date

2020-06-22

Fedora creation date

2015-04-20