We present an analysis of the polarisation dependent scattering loss due to surface and sidewall roughness in thin, shallow-ridge silicon-on-insulator (SOI) waveguides using three dimensional coupled mode theory. The impact on resonant lateral leakage is discussed.
History
Start page
1
End page
3
Total pages
3
Outlet
Proceedings of the 19th Australian Institute of Physics Congress, incorporating the 35th Australian Conference on Optical Fibre Technology
Editors
David Moss
Name of conference
19th Australian Institute of Physics Congress, incorporating the 35th Australian Conference on Optical Fibre Technology