Pt/SnO<sub>2</sub> nanowires/SiC based metal-oxide-semiconductor (MOS) devices were fabricated and tested for their gas sensitivity towards hydrogen. Tin oxide (SnO<sub>2</sub>) nanowires were grown on SiC substrates by the vapour liquid solid growth process. The material properties of the SnO<sub>2</sub> nanowires such as its formation and dimensions were analyzed using scanning electron microscopy (SEM). The current-voltage (I-V) characteristics at different hydrogen concentrations are presented. The effective change in the barrier height for 0.06 and 1% hydrogen were found to be 20.78 and 131.59 meV, respectively. A voltage shift of 310 mV at 530degC for 1% hydrogen was measured.
History
Related Materials
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ISBN - Is published in 9781424412617 (urn:isbn:9781424412617)
Start page
166
End page
169
Total pages
4
Outlet
IEEE Sensors 2007
Editors
Boris Mizaikoff
Name of conference
The 6th IEEE Conference on Sensors, IEEE Sensors 2007