Spatio-Temporal Aware Testing for Complex Systems

conference contribution

posted on 2024-11-03, 12:37 authored by Huai Liu, Jan Olaf Blech, Matt DuckhamMatt Duckham, Heinrich SchmidtHeinrich Schmidt

No description available

History

Related Materials

1.
DOI - Is published in 10.1109/QRS-C.2017.97
2.
ISBN - Is published in 9781538620724 (urn:isbn:9781538620724)

Start page

569

End page

570

Total pages

2

Outlet

IEEE International Conference on Software Quality, Reliability and Security Companion, QRS-C 2017

Name of conference

2017 IEEE International Conference on Software Quality, Reliability and Security Companion

Publisher

Institute of Electrical and Electronics Engineers

Place published

Czech Republic

Start date

2017-07-25

End date

2017-07-29

Language

English

Copyright

© 2017 IEEE

Former Identifier

2006088806

Esploro creation date

2020-06-22

Fedora creation date

2019-03-27

Usage metrics

Scholarly Works

Categories

Keywords

Licence

All rights reserved

Exports