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The electromagnetic relay test system based on TMS320F28335

conference contribution
posted on 2024-10-31, 17:26 authored by Yuye Wang, Fengling HanFengling Han, Wei Xiang, Guangrui Xu
An electromagnetic relay test system is designed based on the 32-bit floating-point Microcontrollers (MCU): TMS320F28335. In the test system, the relay characteristic parameters, such as the coil resistance, pull-in voltage, release voltage and time parameters, can be tested by sampling of the relay coil current, electric shock voltage and drive supply voltage. The tested results can be displayed on the LCD and transmitted to PC. The sampling frequency of the system is 10 M Hertz, which is higher than the other relay test system. The whole system is portable and has low power consumption. Finally, the experimental results verify that the required parameters of the relay can be tested accurately using the designed system.

History

Related Materials

  1. 1.
    DOI - Is published in 10.1109/IECON.2013.6699329
  2. 2.
    ISBN - Is published in 9781479902248 (urn:isbn:9781479902248)

Start page

1355

End page

1358

Total pages

4

Outlet

Proceedings of 39th Annual Conference of the IEEE Industrial-Electronics-Society (IECON)

Editors

Dietmar Dietrich, Ren C. Luo, John Y . Hung

Name of conference

39th Annual Conference of the IEEE Industrial-Electronics-Society (IECON)

Publisher

IEEE

Place published

Piscataway, USA

Start date

2013-11-10

End date

2013-11-14

Language

English

Copyright

© 2013 IEEE

Former Identifier

2006044759

Esploro creation date

2020-06-22

Fedora creation date

2014-06-11

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