RMIT University
Browse

An Explainable Deep Learning Framework for Resilient Intrusion Detection in IoT-Enabled Transportation Networks

journal contribution
posted on 2024-11-02, 22:52 authored by Ayodeji Oseni, Nour Moustafa, Gideon Creech, Nasrin Sohrabi, Andrew Strelzoff, Zahir TariZahir Tari, Igor Linkov
The security of safety-critical IoT systems, such as the Internet of Vehicles (IoV), has a great interest, focusing on using Intrusion Detection Systems (IDS) to recognise cyber-attacks in IoT networks. Deep learning methods are commonly used for the anomaly detection engines of many IDSs because of their ability to learn from heterogeneous data. However, while this type of machine learning model produces high false-positive rates and the reasons behind its predictions are not easily understood, even by experts. The ability to understand or comprehend the reasoning behind the decision of an IDS to block a particular packet helps cybersecurity experts validate the system’s effectiveness and develop more cyber-resilient systems. This paper proposes an explainable deep learning-based intrusion detection framework that helps improve the transparency and resiliency of DL-based IDS in IoT networks. The framework employs a SHapley Additive exPlanations (SHAP) mechanism to interpret decisions made by deep learning-based IDS to experts who rely on the decisions to ensure IoT networks’ security and design more cyber-resilient systems. The proposed framework was validated using the ToN_IoT dataset and compared with other compelling techniques. The experimental results have revealed the high performance of the proposed framework with a 99.15% accuracy and a 98.83% F1 score, illustrating its capability to protect IoV networks against sophisticated cyber-attacks.

History

Related Materials

  1. 1.
    DOI - Is published in 10.1109/TITS.2022.3188671
  2. 2.
    ISSN - Is published in 15249050

Journal

IEEE Transactions on Intelligent Transportation Systems

Volume

24

Issue

1

Start page

1000

End page

1014

Total pages

15

Publisher

Institute of Electrical and Electronics Engineers Inc.

Place published

Piscataway, NJ, USA

Language

English

Copyright

© 2022 IEEE

Former Identifier

2006118944

Esploro creation date

2023-03-26