Bayesian X-bar control limits for exponentially distributed measurements

This article deals with the construction of an X control chart using the Bayesian perspective. We obtain new control limits for the X chart for exponentially distributed data-generating processes through the sequential use of Bayes' theorem and credible intervals. Construction of the control chart is illustrated using a simulated data example. The performance of the proposed, standard, tolerance interval, exponential cumulative sum (CUSUM) and exponential exponentially weighted moving average (EWMA) control limits are examined and compared via a Monte Carlo simulation study. The proposed Bayesian control limits are found to perform better than standard, tolerance interval, exponential EWMA and exponential CUSUM control limits for exponentially distributed processes