Crystallinity and structure of starch using wide angle X-ray scattering

Wide angle X-ray diffraction was used to evaluate the crystalline fraction of a variety of starches, using preliminary smoothing then an iterative smoothing algorithm to estimate amorphous background scattering. This methodology was then used to determine initial crystallinity and monitor gelation and retrogradation of high amylose thermoplastic starch used to produce film. Retrogradation was monitored over a 5-day period. It was found that the starch film retrograded rapidly over the first 12 h with the film displaying both B-type crystallinity and long range amorphous ordering that were separately quantitatively calculated. Changes in starch films, including complete or partial gelatinization, retrogradation and crystallinity, were all determined through wide angle X-ray diffraction.