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Diffraction-limited imaging with monolayer 2D material-based ultrathin flat lenses

journal contribution
posted on 2024-11-02, 22:57 authored by Han LinHan Lin, Zai-Quan Xu, Guiyuan Cao, Yupeng Zhang, Baohua JiaBaohua Jia
Ultrathin flat optics allow control of light at the subwavelength scale that is unmatched by traditional refractive optics. To approach the atomically thin limit, the use of 2D materials is an attractive possibility due to their high refractive indices. However, achievement of diffraction-limited focusing and imaging is challenged by their thickness-limited spatial resolution and focusing efficiency. Here we report a universal method to transform 2D monolayers into ultrathin flat lenses. Femtosecond laser direct writing was applied to generate local scattering media inside a monolayer, which overcomes the longstanding challenge of obtaining sufficient phase or amplitude modulation in atomically thin 2D materials. We achieved highly efficient 3D focusing with subwavelength resolution and diffraction-limited imaging. The high focusing performance even allows diffraction-limited imaging at different focal positions with varying magnifications. Our work paves the way for downscaling of optical devices using 2D materials and reports an unprecedented approach for fabricating ultrathin imaging devices.

Funding

ARC Centre of Excellence in Future Low Energy Electronics Technologies

Australian Research Council

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Perpetual photothermal modulation with scalable hybrid graphene films

Australian Research Council

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Engineering Novel Two-dimensional Materials for Optoelectronic Applications

Australian Research Council

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ARC Training Centre in Surface Engineering for Advanced Materials

Australian Research Council

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History

Journal

Light: Science and Applications

Volume

9

Number

137

Issue

1

Start page

1

End page

11

Total pages

11

Publisher

Springer

Place published

United Kingdom

Language

English

Copyright

© The Author(s) 2020. This article is licensed under a Creative Commons Attribution 4.0 International License.

Former Identifier

2006121824

Esploro creation date

2023-05-12

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