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Discovering Important Nodes of Complex Networks Based on Laplacian Spectra

journal contribution
posted on 2024-11-03, 10:56 authored by Ali Moradi AmaniAli Moradi Amani, Miquel Fiol, Mahdi JaliliMahdi Jalili, Guanrong Chen, Xinghuo YuXinghuo Yu, Lewi StoneLewi Stone
Knowledge of the Laplacian eigenvalues of a network provides important insights into its structural features and dynamical behaviours. Node or link removal caused by possible outage events, such as mechanical and electrical failures or malicious attacks, significantly impacts the Laplacian spectra. This can also happen due to intentional node removal against which, increasing the algebraic connectivity is desired. In this article, an analytical metric is proposed to measure the effect of node removal on the Laplacian eigenvalues of the network. The metric is formulated based on the local multiplicity of each eigenvalue at each node, so that the effect of node removal on any particular eigenvalues can be approximated using only one single eigen-decomposition of the Laplacian matrix. The metric is applicable to undirected networks as well as strongly-connected directed ones. It also provides a reliable approximation for the 'Laplacian energy' of a network. The performance of the metric is evaluated for several synthetic networks and also the American Western States power grid. Results show that this metric has a nearly perfect precision in correctly predicting the most central nodes, and significantly outperforms other comparable heuristic methods.

Funding

Engineering evolving complex network systems through structure intervention

Australian Research Council

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Dynamics and Resilience of Complex Network Systems with Switching Topology

Australian Research Council

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History

Related Materials

  1. 1.
    DOI - Is published in 10.1109/TCSI.2023.3302332
  2. 2.
    ISSN - Is published in 15498328

Journal

IEEE Transactions on Circuits and Systems I: Regular Papers

Volume

70

Issue

10

Start page

4146

End page

4158

Total pages

13

Publisher

IEEE

Place published

United States

Language

English

Copyright

© 2023 IEEE.

Former Identifier

2006126770

Esploro creation date

2023-12-10

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