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Effective Sampling: Fast Segmentation Using Robust Geometric Model Fitting

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posted on 2024-11-23, 10:50 authored by Ruwan TennakoonRuwan Tennakoon, Alireza Sadri, Reza HoseinnezhadReza Hoseinnezhad, Alireza Bab-HadiasharAlireza Bab-Hadiashar
Identifying the underlying models in a set of data points that is contaminated by noise and outliers leads to a highly complex multi-model fitting problem. This problem can be posed as a clustering problem by the projection of higher-order affinities between data points into a graph, which can be clustered using spectral clustering. Calculating all possible higher-order affinities is computationally expensive. Hence, in most cases, only a subset is used. In this paper, we propose an effective sampling method for obtaining a highly accurate approximation of the full graph, which is required to solve multi-structural model fitting problems in computer vision. The proposed method is based on the observation that the usefulness of a graph for segmentation improves as the distribution of the hypotheses that are used to build the graph approaches the distribution of the actual parameters for the given data. In this paper, we approximate this actual parameter distribution by using a k th-order statistics-based cost function, and the samples are generated using a greedy algorithm that is coupled with a data sub-sampling strategy. The experimental analysis shows that the proposed method is both accurate and computationally efficient compared with the state-of-the-art robust multi-model fitting techniques. The implementation of the method is publicly available from https://github.com/RuwanT/model-fitting-cbs.

Funding

Visual intelligence for safe vehicle operation in industrial environment

Australian Research Council

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History

Related Materials

  1. 1.
    DOI - Is published in 10.1109/TIP.2018.2834821
  2. 2.
    ISSN - Is published in 10577149

Journal

IEEE Transactions on Image Processing

Volume

27

Issue

9

Start page

4182

End page

4194

Total pages

13

Publisher

IEEE

Place published

United States

Language

English

Copyright

© 2018 IEEE Personal use is permitted, but republication/redistribution requires IEEE permission.

Notes

© 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works

Former Identifier

2006084402

Esploro creation date

2020-06-22

Fedora creation date

2018-09-21

Open access

  • Yes

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