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Energetic deposition, measurement and simulation of graphitic contacts to 6H-SiC

journal contribution
posted on 2024-11-02, 02:56 authored by Hiep Le Ngoc Tran, Masturina Kracica, Dougal McCullochDougal McCulloch, Edwin Mayes, Anthony HollandAnthony Holland, James PartridgeJames Partridge
Junctions between energetically deposited graphitic carbon and n-type 6H-SiC have been fabricated. Their current-voltage characteristics have been measured and compared with simulations using Sentaurus TCAD finite element software. Agreement between the experimental and simulated current-voltage characteristics was achieved using parameters derived from electrical measurements and electron microscopy. Using the best-fit models, the effects of interfacial layers and contact work function variations were elucidated to provide guidance for improved device performance.

History

Related Materials

  1. 1.
    DOI - Is published in 10.1016/j.microrel.2017.02.017
  2. 2.
    ISSN - Is published in 00262714

Journal

Microelectronics Reliability

Volume

71

Start page

82

End page

85

Total pages

4

Publisher

Elsevier

Place published

United Kingdom

Language

English

Copyright

© 2017 Elsevier Ltd. All rights reserved.

Former Identifier

2006072499

Esploro creation date

2020-06-22

Fedora creation date

2017-04-06

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