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Memristor and selector devices fabricated from HfO2-xNx

journal contribution
posted on 2024-11-02, 01:12 authored by B Murdoch, Dougal McCullochDougal McCulloch, R. Ganesan, D McKenzie, M. Bilek, James PartridgeJames Partridge
Monoclinic HfO2-xNx has been incorporated into two-terminal devices exhibiting either memristor or selector operation depending on the controlled inclusion/suppression of mobile oxygen vacancies. In HfO2 memristors containing oxygen vacancies, gradual conductance modulation, short-term plasticity, and long-term potentiation were observed using appropriate voltage-spike stimulation, suggesting suitability for artificial neural networks. Passivation of oxygen vacancies, confirmed by X-ray absorption spectroscopy, was achieved in HfO2-xNx films by the addition of nitrogen during growth. Selector devices formed on these films exhibited threshold switching and current controlled negative differential resistance consistent with thermally driven insulator to metal transitions.

History

Journal

Applied Physics Letters

Volume

108

Number

143504

Issue

14

Start page

1

End page

4

Total pages

4

Publisher

A I P Publishing LLC

Place published

United States

Language

English

Copyright

© 2016 AIP Publishing LLC.

Former Identifier

2006062270

Esploro creation date

2020-06-22

Fedora creation date

2016-06-02

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