Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates

Sriram, Sharath; Bhaskaran, Madhu; Mitchell, D R G; Short, Ken; Holland, Anthony; Mitchell, Arnan

Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates

journal contribution

posted on 2024-11-23, 07:15 authored by Sharath SriramSharath Sriram, Madhu BhaskaranMadhu Bhaskaran, D R G Mitchell, Ken Short, Anthony HollandAnthony Holland, Arnan MitchellArnan Mitchell

This article discusses the results of transmission electron microscopy (TEM)-based characterization of strontium-doped lead zirconate titanate (PSZT) thin films. The thin films were deposited by radio frequency magnetron sputtering at 300C on gold-coated

History

Journal

Microscopy and Microanalysis

Volume

15

Issue

1

Start page

30

End page

35

Total pages

6

Publisher

Cambridge University Press

Place published

New York

Language

English

Copyright

Former Identifier

2006011903

Esploro creation date

2020-06-22

Fedora creation date

2009-11-18

Open access

Yes

Usage metrics

Keywords

Interdiffusion SIMS Strontium-doped PZT thin films TEM

Microstructural and compositional analysis of strontium-doped lead zirconate titanate thin films on gold-coated silicon substrates

History

Journal

Volume

Issue

Start page

End page

Total pages

Publisher

Place published

Language

Copyright

Former Identifier

Esploro creation date

Fedora creation date

Open access

Usage metrics

Categories

Keywords

Licence

Exports