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Modeling of capacitor parameters related to the metal film layer with partial edge disconnection

journal contribution
posted on 2024-11-01, 04:28 authored by Robert Brown
Portions of the metallized surface in metallized polypropylene capacitors, can lose direct connection with the schooping variously by sparking, mechanical forces, and corrosion. This results in lengthened connection pathways which in turn leads to rapidly increased dissipation factors and increased localized current density. Such outcomes threaten the endurance of the capacitor and may be a key factor in catastrophic failures in the field. In this paper, concentrating on symmetrical edge-disconnection whereby both layers are disconnected for the same lengths, the characteristics of edge-disconnected wound metal strip are modeled using distributed circuit analysis. It is shown that equivalent series resistance (R-Es) and equivalent series capacitance (C-Es) ultimately reduce with the square root of frequency. Empirically-derived formulae for these and for the alternate capacitor model of equivalent parallel resistance (REP) and equivalent parallel capacitance (C-EP) are demonstrated. It is shown that for symmetrical edge-disconnection, impedance represented by series distributed inductance is negligible for most considerations compared to ohmic resistance. Lead and package inductance are external to this analysis and are not included.

History

Related Materials

  1. 1.
    DOI - Is published in 10.1109/TCAPT.2007.906692
  2. 2.
    ISSN - Is published in 15213331

Journal

IEEE Transactions on Components and Packaging Technologies

Volume

30

Start page

774

End page

780

Total pages

7

Publisher

IEEE

Place published

Piscataway

Language

English

Copyright

© 2007 IEEE

Former Identifier

2006005845

Esploro creation date

2020-06-22

Fedora creation date

2011-01-07

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